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ZnO nanowire-embedded Schottky diode for effective UV detection by the barrier reduction effect

  • Joondong Kim
  • , Ju Hyung Yun
  • , Chang Hyun Kim
  • , Yun Chang Park
  • , Ju Yeon Woo
  • , Jeunghee Park
  • , Jung Ho Lee
  • , Junsin Yi
  • , Chang Soo Han
  • Korea Institute of Machinery and Materials
  • Korea University
  • National NanoFab Center
  • Hanyang University

Research output: Contribution to journalArticlepeer-review

Abstract

A zinc oxide nanowire(ZnO NW)-embedded Schottky diode was fabricated for UV detection. Two types of devices were prepared. The ZnO NW was positioned onto asymmetric metal electrodes (Al and Pt) for a Schottky device or symmetric metal electrodes (Al and Al) for an ohmic device, respectively. The Schottky device provided a rectifying current flow and was more sensitive to UV illumination than the ohmic device. The Schottky barrier plays an important role for UV detection by a UV-induced barrier reduction effect. The fabrication of the ZnO NW-embedded Schottky diode and the UV reaction mechanism are discussed in light of the UV light-induced Schottky barrier reduction effect.

Original languageEnglish
Article number115205
JournalNanotechnology
Volume21
Issue number11
DOIs
StatePublished - 2010

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