Zinc silicate phosphor: Insights of X-ray induced and temperature enabled luminescence

  • P. Diana
  • , Subramanian Saravanakumar
  • , D. Sivaganesh
  • , V. Sivakumar
  • , Yang Li
  • , S. Sebastian
  • , Ji Man Kim
  • , Padmanathan Karthick Kannan
  • , L. Sangeetha
  • , Vijayendran K.K. Praneeth

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The present investigation deals with the effect of calcination temperature on the structural and thermoluminescent (TL) properties of Zn2SiO4 materials. For this study, Zn2SiO4 was prepared via a simple hydrothermal route and calcinated at temperatures from 700°C to 1100°C in an air atmosphere. TL data of all Zn2SiO4 samples showed two peaks at around 240°C and 330°C due to the formation of the luminescence centre during X-ray irradiation. More interestingly, the Zn2SiO4 sample calcinated at 900°C exhibited a shift in the TL peak (282°C and 354°C) with an optimal TL intensity attributed to its good crystallinity with a well-defined hexagonal plate-like morphology. X-ray-irradiated Zn2SiO4 samples calcinated at 900°C exhibited a high-temperature TL glow curve peak, suggesting that the present material could be used for high-temperature dosimetry applications.

Original languageEnglish
Pages (from-to)625-636
Number of pages12
JournalLuminescence
Volume38
Issue number5
DOIs
StatePublished - May 2023

Keywords

  • dosimetry applications
  • Rietveld refinement
  • thermoluminescence
  • ZnSiO

Fingerprint

Dive into the research topics of 'Zinc silicate phosphor: Insights of X-ray induced and temperature enabled luminescence'. Together they form a unique fingerprint.

Cite this