Wild band edges: The role of bandgap grading and band-edge fluctuations in high-efficiency chalcogenide devices

Ingrid Repins; Lorelle Mansfield; Ana Kanevce; Soren A. Jensen; Darius Kuciauskas; Stephen Glynn; Teresa Barnes; Wyatt Metzger; James Burst; Chun Sheng Jiang; Patricia Dippo; Steve Harvey; Glenn Teeter; C. Perkins; Brian Egaas; Andriy Zakutayev; Jan Hendrik Alsmeier; Thomas Lusky; Lars Korte; Regan G. Wilks; Marcus Bar; Yanfa Yan; Stephan Lany; Pawel Zawadzki; Ji Sang Park; Suhuai Wei

doi:10.1109/PVSC.2016.7749600

Wild band edges: The role of bandgap grading and band-edge fluctuations in high-efficiency chalcogenide devices

Ingrid Repins
, Lorelle Mansfield
, Ana Kanevce
, Soren A. Jensen
, Darius Kuciauskas
, Stephen Glynn
, Teresa Barnes
, Wyatt Metzger
, James Burst
, Chun Sheng Jiang
, Patricia Dippo
, Steve Harvey
, Glenn Teeter
, C. Perkins
, Brian Egaas
, Andriy Zakutayev
, Jan Hendrik Alsmeier
, Thomas Lusky
, Lars Korte
, Regan G. Wilks

Marcus Bar, Yanfa Yan, Stephan Lany, Pawel Zawadzki, Ji Sang Park, Suhuai Wei

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

20 Scopus citations

Abstract

Band-edge effects - including grading, electrostatic fluctuations, bandgap fluctuations, and band tails - affect chalcogenide device efficiency. These effects now require more careful consideration as efficiencies increase beyond 20%. Several aspects of the relationships between band-edge phenomena and device performance for NREL absorbers are examined. For Cu(In, Ga)Se2 devices, recent increases in diffusion length imply changes to the optimum bandgap profile. The origin, impact, and modification of electrostatic and bandgap fluctuations are also discussed. The application of the same principles to devices based on CdTe, kesterites, and emerging absorbers (Cu₂SnS₃, CuSbS₂), considering differences in materials properties, is examined.

Original language	English
Title of host publication	2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	309-314
Number of pages	6
ISBN (Electronic)	9781509027248
DOIs	https://doi.org/10.1109/PVSC.2016.7749600
State	Published - 18 Nov 2016
Externally published	Yes
Event	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States Duration: 5 Jun 2016 → 10 Jun 2016

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
Volume	2016-November
ISSN (Print)	0160-8371

Conference

Conference	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/Territory	United States
City	Portland
Period	5/06/16 → 10/06/16

Keywords

CAS
CdTe
CIGS
CTS
CZTS
defect
fluctuations
grading

Access to Document

10.1109/PVSC.2016.7749600

Cite this

Repins, I., Mansfield, L., Kanevce, A., Jensen, S. A., Kuciauskas, D., Glynn, S., Barnes, T., Metzger, W., Burst, J., Jiang, C. S., Dippo, P., Harvey, S., Teeter, G., Perkins, C., Egaas, B., Zakutayev, A., Alsmeier, J. H., Lusky, T., Korte, L., ... Wei, S. (2016). Wild band edges: The role of bandgap grading and band-edge fluctuations in high-efficiency chalcogenide devices. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 (pp. 309-314). Article 7749600 (Conference Record of the IEEE Photovoltaic Specialists Conference; Vol. 2016-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2016.7749600

Repins, Ingrid ; Mansfield, Lorelle ; Kanevce, Ana et al. / Wild band edges : The role of bandgap grading and band-edge fluctuations in high-efficiency chalcogenide devices. 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 309-314 (Conference Record of the IEEE Photovoltaic Specialists Conference).

@inproceedings{97e477bb5aa74a7f94e68236ab310070,

title = "Wild band edges: The role of bandgap grading and band-edge fluctuations in high-efficiency chalcogenide devices",

abstract = "Band-edge effects - including grading, electrostatic fluctuations, bandgap fluctuations, and band tails - affect chalcogenide device efficiency. These effects now require more careful consideration as efficiencies increase beyond 20\%. Several aspects of the relationships between band-edge phenomena and device performance for NREL absorbers are examined. For Cu(In, Ga)Se2 devices, recent increases in diffusion length imply changes to the optimum bandgap profile. The origin, impact, and modification of electrostatic and bandgap fluctuations are also discussed. The application of the same principles to devices based on CdTe, kesterites, and emerging absorbers (Cu2SnS3, CuSbS2), considering differences in materials properties, is examined.",

keywords = "CAS, CdTe, CIGS, CTS, CZTS, defect, fluctuations, grading",

author = "Ingrid Repins and Lorelle Mansfield and Ana Kanevce and Jensen, \{Soren A.\} and Darius Kuciauskas and Stephen Glynn and Teresa Barnes and Wyatt Metzger and James Burst and Jiang, \{Chun Sheng\} and Patricia Dippo and Steve Harvey and Glenn Teeter and C. Perkins and Brian Egaas and Andriy Zakutayev and Alsmeier, \{Jan Hendrik\} and Thomas Lusky and Lars Korte and Wilks, \{Regan G.\} and Marcus Bar and Yanfa Yan and Stephan Lany and Pawel Zawadzki and Park, \{Ji Sang\} and Suhuai Wei",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 ; Conference date: 05-06-2016 Through 10-06-2016",

year = "2016",

month = nov,

day = "18",

doi = "10.1109/PVSC.2016.7749600",

language = "English",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "309--314",

booktitle = "2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016",

}

Repins, I, Mansfield, L, Kanevce, A, Jensen, SA, Kuciauskas, D, Glynn, S, Barnes, T, Metzger, W, Burst, J, Jiang, CS, Dippo, P, Harvey, S, Teeter, G, Perkins, C, Egaas, B, Zakutayev, A, Alsmeier, JH, Lusky, T, Korte, L, Wilks, RG, Bar, M, Yan, Y, Lany, S, Zawadzki, P, Park, JS & Wei, S 2016, Wild band edges: The role of bandgap grading and band-edge fluctuations in high-efficiency chalcogenide devices. in 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016., 7749600, Conference Record of the IEEE Photovoltaic Specialists Conference, vol. 2016-November, Institute of Electrical and Electronics Engineers Inc., pp. 309-314, 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States, 5/06/16. https://doi.org/10.1109/PVSC.2016.7749600

Wild band edges: The role of bandgap grading and band-edge fluctuations in high-efficiency chalcogenide devices. / Repins, Ingrid; Mansfield, Lorelle; Kanevce, Ana et al.
2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. 309-314 7749600 (Conference Record of the IEEE Photovoltaic Specialists Conference; Vol. 2016-November).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Wild band edges

T2 - 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016

AU - Repins, Ingrid

AU - Mansfield, Lorelle

AU - Kanevce, Ana

AU - Jensen, Soren A.

AU - Kuciauskas, Darius

AU - Glynn, Stephen

AU - Barnes, Teresa

AU - Metzger, Wyatt

AU - Burst, James

AU - Jiang, Chun Sheng

AU - Dippo, Patricia

AU - Harvey, Steve

AU - Teeter, Glenn

AU - Perkins, C.

AU - Egaas, Brian

AU - Zakutayev, Andriy

AU - Alsmeier, Jan Hendrik

AU - Lusky, Thomas

AU - Korte, Lars

AU - Wilks, Regan G.

AU - Bar, Marcus

AU - Yan, Yanfa

AU - Lany, Stephan

AU - Zawadzki, Pawel

AU - Park, Ji Sang

AU - Wei, Suhuai

PY - 2016/11/18

Y1 - 2016/11/18

N2 - Band-edge effects - including grading, electrostatic fluctuations, bandgap fluctuations, and band tails - affect chalcogenide device efficiency. These effects now require more careful consideration as efficiencies increase beyond 20%. Several aspects of the relationships between band-edge phenomena and device performance for NREL absorbers are examined. For Cu(In, Ga)Se2 devices, recent increases in diffusion length imply changes to the optimum bandgap profile. The origin, impact, and modification of electrostatic and bandgap fluctuations are also discussed. The application of the same principles to devices based on CdTe, kesterites, and emerging absorbers (Cu2SnS3, CuSbS2), considering differences in materials properties, is examined.

AB - Band-edge effects - including grading, electrostatic fluctuations, bandgap fluctuations, and band tails - affect chalcogenide device efficiency. These effects now require more careful consideration as efficiencies increase beyond 20%. Several aspects of the relationships between band-edge phenomena and device performance for NREL absorbers are examined. For Cu(In, Ga)Se2 devices, recent increases in diffusion length imply changes to the optimum bandgap profile. The origin, impact, and modification of electrostatic and bandgap fluctuations are also discussed. The application of the same principles to devices based on CdTe, kesterites, and emerging absorbers (Cu2SnS3, CuSbS2), considering differences in materials properties, is examined.

KW - CAS

KW - CdTe

KW - CIGS

KW - CTS

KW - CZTS

KW - defect

KW - fluctuations

KW - grading

UR - https://www.scopus.com/pages/publications/85003633072

U2 - 10.1109/PVSC.2016.7749600

DO - 10.1109/PVSC.2016.7749600

M3 - Conference contribution

AN - SCOPUS:85003633072

T3 - Conference Record of the IEEE Photovoltaic Specialists Conference

SP - 309

EP - 314

BT - 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 5 June 2016 through 10 June 2016

ER -

Repins I, Mansfield L, Kanevce A, Jensen SA, Kuciauskas D, Glynn S et al. Wild band edges: The role of bandgap grading and band-edge fluctuations in high-efficiency chalcogenide devices. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. 309-314. 7749600. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2016.7749600

Wild band edges: The role of bandgap grading and band-edge fluctuations in high-efficiency chalcogenide devices

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Keywords

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