White noise characteristics of nanoscale MOSFETs in all operating regions

Jongwook Jeon; Byung Gook Park; Jong Duk Lee; Hyungcheol Shin

doi:10.1109/SNW.2008.5418476

White noise characteristics of nanoscale MOSFETs in all operating regions

Jongwook Jeon, Byung Gook Park, Jong Duk Lee, Hyungcheol Shin

Seoul National University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008
DOIs	https://doi.org/10.1109/SNW.2008.5418476
State	Published - 2008
Externally published	Yes
Event	IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008 - Honolulu, HI, United States Duration: 15 Jun 2008 → 16 Jun 2008

Publication series

Name	IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008

Conference

Conference	IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008
Country/Territory	United States
City	Honolulu, HI
Period	15/06/08 → 16/06/08

Access to Document

10.1109/SNW.2008.5418476

Cite this

@inproceedings{cdd9670a3b9141cc8ad7840d2902c3db,

title = "White noise characteristics of nanoscale MOSFETs in all operating regions",

author = "Jongwook Jeon and Park, \{Byung Gook\} and Lee, \{Jong Duk\} and Hyungcheol Shin",

year = "2008",

doi = "10.1109/SNW.2008.5418476",

language = "English",

isbn = "9781424420711",

series = "IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008",

booktitle = "IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008",

note = "IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008 ; Conference date: 15-06-2008 Through 16-06-2008",

}

Jeon, J, Park, BG, Lee, JD & Shin, H 2008, White noise characteristics of nanoscale MOSFETs in all operating regions. in IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008., 5418476, IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008, IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008, Honolulu, HI, United States, 15/06/08. https://doi.org/10.1109/SNW.2008.5418476

TY - GEN

T1 - White noise characteristics of nanoscale MOSFETs in all operating regions

AU - Jeon, Jongwook

AU - Park, Byung Gook

AU - Lee, Jong Duk

AU - Shin, Hyungcheol

PY - 2008

Y1 - 2008

UR - https://www.scopus.com/pages/publications/77949962513

U2 - 10.1109/SNW.2008.5418476

DO - 10.1109/SNW.2008.5418476

M3 - Conference contribution

AN - SCOPUS:77949962513

SN - 9781424420711

T3 - IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008

BT - IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008

T2 - IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008

Y2 - 15 June 2008 through 16 June 2008

ER -

White noise characteristics of nanoscale MOSFETs in all operating regions

Publication series

Conference

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