TY - JOUR
T1 - Wafer-scale floating gate memristor array using 2D-graphene/3D-Al2O3/ZnO heterostructures for neuromorphic system
AU - Vu, Thi Thanh Huong
AU - Park, Mi Hyang
AU - Phan, Thanh Luan
AU - Park, Hyun Jun
AU - Vu, Van Tu
AU - Kim, Hyung Jin
AU - Aggarwal, Pallavi
AU - Won, Ui Yeon
AU - Li, Huamin
AU - Kim, Whan Kyun
AU - Yu, Woo Jong
N1 - Publisher Copyright:
© 2025 Elsevier B.V.
PY - 2025/4/30
Y1 - 2025/4/30
N2 - Floating gate memristors (FGMEMs) made of 2-dimensional (2D) materials, operating as two- or multi-terminals to charge and discharge a graphene floating gate (FG), can mimic the functions of synapses and neurons for neuromorphic computing. A large-area chemical vapor deposition for transition metal dichalcogenides (semiconductors) and h-BN (insulators) enables wafer-scale integration. However, it faces challenges with uniformity, thickness control, and oxidation. Here, we demonstrate reliable 4-inch wafer-scale integration of FGMEM arrays using well-established materials of 2D graphene FG, 3D Al2O3 tunneling insulator and 3D ZnO channel. Among 200 random devices in the 4-inch wafer memristor array, 92.5 % exhibit on/off ratios exceeding 103, averaging 106. The bottom graphene FGMEM (B-FGMEM) forms a uniform Al2O3/graphene interface, whereas the step height from patterned ZnO in the top graphene FGMEM (T-FGMEM) results in a rough, incomplete interface. B-FGMEMs demonstrate a retention of 4 × 104 s and endurance of 104 cycles, surpassing the stability of T-FGMEMs by over 10 times. Furthermore, B-FGMEMs exhibit high stability against electrical fatigue of 4000 cycles. In pattern recognition simulations, B-FGMEM achieves a better accuracy of 88.2 % with excellent non-linearity (βp = 1.8, βd = 1.7) compared to the 66.9 % accuracy of T-FGMEM with poor non-linearity (βp = 2.8, βd = 4.6).
AB - Floating gate memristors (FGMEMs) made of 2-dimensional (2D) materials, operating as two- or multi-terminals to charge and discharge a graphene floating gate (FG), can mimic the functions of synapses and neurons for neuromorphic computing. A large-area chemical vapor deposition for transition metal dichalcogenides (semiconductors) and h-BN (insulators) enables wafer-scale integration. However, it faces challenges with uniformity, thickness control, and oxidation. Here, we demonstrate reliable 4-inch wafer-scale integration of FGMEM arrays using well-established materials of 2D graphene FG, 3D Al2O3 tunneling insulator and 3D ZnO channel. Among 200 random devices in the 4-inch wafer memristor array, 92.5 % exhibit on/off ratios exceeding 103, averaging 106. The bottom graphene FGMEM (B-FGMEM) forms a uniform Al2O3/graphene interface, whereas the step height from patterned ZnO in the top graphene FGMEM (T-FGMEM) results in a rough, incomplete interface. B-FGMEMs demonstrate a retention of 4 × 104 s and endurance of 104 cycles, surpassing the stability of T-FGMEMs by over 10 times. Furthermore, B-FGMEMs exhibit high stability against electrical fatigue of 4000 cycles. In pattern recognition simulations, B-FGMEM achieves a better accuracy of 88.2 % with excellent non-linearity (βp = 1.8, βd = 1.7) compared to the 66.9 % accuracy of T-FGMEM with poor non-linearity (βp = 2.8, βd = 4.6).
KW - AlO tunneling insulator
KW - Artificial synapses
KW - Floating gate memristor
KW - Graphene floating gate
KW - Wafer-scale integration
UR - https://www.scopus.com/pages/publications/85215844835
U2 - 10.1016/j.apsusc.2025.162460
DO - 10.1016/j.apsusc.2025.162460
M3 - Article
AN - SCOPUS:85215844835
SN - 0169-4332
VL - 689
JO - Applied Surface Science
JF - Applied Surface Science
M1 - 162460
ER -