TY - GEN
T1 - VM-aware Flush Mechanism for Mitigating Inter-VM I/O Interference
AU - Lee, Taehyung
AU - Lee, Minho
AU - Eom, Young Ik
N1 - Publisher Copyright:
© 2019 EDAA.
PY - 2019/5/14
Y1 - 2019/5/14
N2 - Consolidating multiple servers into a physical machine is now commonplace in cloud infrastructures. The virtualized systems often arrange virtual disks of multiple virtual machines (VMs) on the same underlying storage device while striving to guarantee the performance service level objective (SLO) for each VM. Unfortunately, sync operations called by a VM make it hard to satisfy the performance SLO by disturbing I/O activities of other VMs. We reveal that the disk cache flush command is a root cause of this problem and present a novel VM-aware flush mechanism, called vFLUSH, which supports the VM-based persistency control of the disk cache flush command. Our evaluation shows that vFLUSH reduces the average latency of disk cache flush commands by up to 52.0% and improves the overall I/O performance by up to 59.6% on real workloads.
AB - Consolidating multiple servers into a physical machine is now commonplace in cloud infrastructures. The virtualized systems often arrange virtual disks of multiple virtual machines (VMs) on the same underlying storage device while striving to guarantee the performance service level objective (SLO) for each VM. Unfortunately, sync operations called by a VM make it hard to satisfy the performance SLO by disturbing I/O activities of other VMs. We reveal that the disk cache flush command is a root cause of this problem and present a novel VM-aware flush mechanism, called vFLUSH, which supports the VM-based persistency control of the disk cache flush command. Our evaluation shows that vFLUSH reduces the average latency of disk cache flush commands by up to 52.0% and improves the overall I/O performance by up to 59.6% on real workloads.
UR - https://www.scopus.com/pages/publications/85066612095
U2 - 10.23919/DATE.2019.8714837
DO - 10.23919/DATE.2019.8714837
M3 - Conference contribution
AN - SCOPUS:85066612095
T3 - Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
SP - 1501
EP - 1506
BT - Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
Y2 - 25 March 2019 through 29 March 2019
ER -