Skip to main navigation Skip to search Skip to main content

Vertically scaled MOSFET gate stacks and junctions: How far are we likely to go?

  • Carlton M. Osburn
  • , Indong Kim
  • , Sungkee Han
  • , Indranil De
  • , Kam F. Yee
  • , Shyam Gannavaram
  • , Sung Joo Lee
  • , Chung Ho Lee
  • , Zhijiong J. Luo
  • , Wenjuan Zhu
  • , John R. Hauser
  • , Dim Lee Kwong
  • , Gerald Lucovsky
  • , T. P. Ma
  • , Mehmet C. Öztürk
  • North Carolina State University
  • KLA-Tencor Corporation
  • Access Network Division
  • Intel
  • University of Texas at Austin
  • Yale University

Research output: Contribution to journalReview articlepeer-review

Fingerprint

Dive into the research topics of 'Vertically scaled MOSFET gate stacks and junctions: How far are we likely to go?'. Together they form a unique fingerprint.
Sort by

Engineering

Material Science