Abstract
Wide bandgap semiconductors such as gallium oxide (Ga2O3) have attracted much attention for their use in next-generation high-power electronics. Although single-crystal Ga2O3 substrates can be routinely grown from melt along various orientations, the influence of such orientations has been seldom reported. Further, making rectifying p-n diodes from Ga2O3 has been difficult due to lack of p-type doping. In this study, we fabricated and optimized 2D/3D vertical diodes on β-Ga2O3 by varying the following three factors: substrate planar orientation, choice of 2D material and metal contacts. The quality of our devices was validated using high-temperature dependent measurements, atomic-force microscopy (AFM) techniques and technology computer-aided design (TCAD) simulations. Our findings suggest that 2D/3D β-Ga2O3 vertical heterojunctions are optimized by substrate planar orientation (−201), combined with 2D WS2 exfoliated layers and Ti contacts, and show record rectification ratios (>106) concurrently with ON-Current density (>103 A cm−2) for application in power rectifiers.
| Original language | English |
|---|---|
| Pages (from-to) | 9964-9972 |
| Number of pages | 9 |
| Journal | Nanoscale |
| Volume | 15 |
| Issue number | 23 |
| DOIs | |
| State | Published - 23 May 2023 |
| Externally published | Yes |