Ultraviolet tip-enhanced nanoscale Raman imaging

Kyoung Duck Park, Yong Hwan Kim, Jin Ho Park, Jung Su Park, Hong Seok Lee, Sang Youp Yim, Young Hee Lee, Mun Seok Jeong

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

We have constructed an ultraviolet (UV)-apertureless near-field scanning optical microscope-Raman spectroscopy system by using an aluminum tip for the simultaneous measurement of topography and Raman scattering of nanomaterials with high spatial resolution. The topography, Rayleigh scattering image, and tip-enhanced Raman scattering image of the carbon nanotube film showed that a spatial resolution of around 19 nm was achieved. This spatial resolution of UV-Raman mapping image exceeds that of previous approaches, which have several hundred nanometers of spatial resolution.

Original languageEnglish
Pages (from-to)1931-1934
Number of pages4
JournalJournal of Raman Spectroscopy
Volume43
Issue number12
DOIs
StatePublished - Dec 2012

Keywords

  • aluminum
  • carbon nanotube film
  • near-field scanning optical microscope (NSOM)
  • tip-enhanced Raman scattering (TERS)
  • ultraviolet (UV)

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