Abstract
We have constructed an ultraviolet (UV)-apertureless near-field scanning optical microscope-Raman spectroscopy system by using an aluminum tip for the simultaneous measurement of topography and Raman scattering of nanomaterials with high spatial resolution. The topography, Rayleigh scattering image, and tip-enhanced Raman scattering image of the carbon nanotube film showed that a spatial resolution of around 19 nm was achieved. This spatial resolution of UV-Raman mapping image exceeds that of previous approaches, which have several hundred nanometers of spatial resolution.
| Original language | English |
|---|---|
| Pages (from-to) | 1931-1934 |
| Number of pages | 4 |
| Journal | Journal of Raman Spectroscopy |
| Volume | 43 |
| Issue number | 12 |
| DOIs | |
| State | Published - Dec 2012 |
Keywords
- aluminum
- carbon nanotube film
- near-field scanning optical microscope (NSOM)
- tip-enhanced Raman scattering (TERS)
- ultraviolet (UV)