Transparent indium oxide films doped with high Lewis acid strength Ge dopant for phosphorescent organic light-emitting diodes

  • Sin Bi Kang
  • , Jong Wook Lim
  • , Sunghun Lee
  • , Jang Joo Kim
  • , Han Ki Kim

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

We report on Ge-doped In 2O 3(IGO) films prepared by co-sputtering GeO 2 and In 2O 3 targets for anode of phosphorescent organic light-emitting diodes (POLEDs). Under optimized annealing conditions, the IGO film exhibited a low sheet resistance of 14.0Ω/square, a high optical transmittance of 86.9% and a work function of 5.2eV, comparable to conventional Sn-doped In 2O 3 (ITO) films. Due to the higher Lewis acid strength of the Ge 4+ ion (3.06) than that of Sn 3+(1.62), the IGO film showed higher transparency in the near infrared and higher carrier mobility of 39.16cm 2V 1s 1 than the ITO films. In addition, the strongly preferred (222) orientation of the IGO grains, caused by Zone II grain growth during rapid thermal annealing, increased the carrier mobility and improved the surface morphology of the IGO film. POLEDs fabricated on IGO anodes showed identical current density-voltage-luminance curves and efficiencies to POLEDs with ITO electrodes due to the low sheet resistance and high transmittance of the IGO anode.

Original languageEnglish
Article number325102
JournalJournal of Physics D: Applied Physics
Volume45
Issue number32
DOIs
StatePublished - 15 Aug 2012
Externally publishedYes

Fingerprint

Dive into the research topics of 'Transparent indium oxide films doped with high Lewis acid strength Ge dopant for phosphorescent organic light-emitting diodes'. Together they form a unique fingerprint.

Cite this