TY - GEN
T1 - Transmission property of adhesive interconnect for high frequency applications
AU - Kim, Jong Woong
AU - Lee, Young Chul
AU - Ko, Jae Hoon
AU - Nah, Wansoo
AU - Jung, Seung Boo
PY - 2007
Y1 - 2007
N2 - The radio frequency (RF) and high frequency performance of the flip chip interconnects with anisotropic conductive film (ACF) and non-conductive film (NCF) was investigated by measuring the scattering parameters (S-parameters) of the flip chip modules. The effects of two chip materials, Si and gallium arsenide (GaAs), and of the metal pattern gap between the signal line and ground plane in the coplanar waveguide (CPW) on the RF performance of the flip chip module were also investigated. The transmission properties of the GaAs were markedly improved on those of the Si chip, which was not suitable for the measurement of the S-parameters of the flip chip interconnect. Extracted impedance parameters showed that the RF performance of the flip chip interconnect with NCF was slightly better than that of the interconnect with ACF, mainly due to the self inductance of the conductive particle surface and the mutual inductance between the conductive particles in the ACF interconnect.
AB - The radio frequency (RF) and high frequency performance of the flip chip interconnects with anisotropic conductive film (ACF) and non-conductive film (NCF) was investigated by measuring the scattering parameters (S-parameters) of the flip chip modules. The effects of two chip materials, Si and gallium arsenide (GaAs), and of the metal pattern gap between the signal line and ground plane in the coplanar waveguide (CPW) on the RF performance of the flip chip module were also investigated. The transmission properties of the GaAs were markedly improved on those of the Si chip, which was not suitable for the measurement of the S-parameters of the flip chip interconnect. Extracted impedance parameters showed that the RF performance of the flip chip interconnect with NCF was slightly better than that of the interconnect with ACF, mainly due to the self inductance of the conductive particle surface and the mutual inductance between the conductive particles in the ACF interconnect.
UR - https://www.scopus.com/pages/publications/51249115646
U2 - 10.1109/EMAP.2007.4510286
DO - 10.1109/EMAP.2007.4510286
M3 - Conference contribution
AN - SCOPUS:51249115646
SN - 1424419093
SN - 9781424419098
T3 - EMAP 2007 - International Conference on Electronic Materials and Packaging 2007
BT - EMAP 2007- International Conference on Electronic Materials and Packaging 2007
T2 - International Conference on Electronic Materials and Packaging 2007, EMAP 2007
Y2 - 19 November 2007 through 22 November 2007
ER -