Time-dependent current-voltage relation in electron guns

Byung Mook Weon, Jung Ho Je

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

We studied mathematical models for degradation behaviors of current and voltage in electron guns especially using oxide cathodes. We found that the current and the voltage, I(t) and V(t), follow the stretched exponential decay in oxide cathodes. On this basis, we derived a general expression for the time-dependent current-voltage relation as I(t)=p(t)V(t) δ(t) where δ(t) is a time-dependent exponent and the perveance, p(t), is a function of δ(t). The exponent δ(t) indicates the deviation of the classical Child-Langmuir relation (I-pV 3/2). This deviation is attributed to the gradual change of the electron gun geometry over time.

Original languageEnglish
Article number036101
JournalJournal of Applied Physics
Volume97
Issue number3
DOIs
StatePublished - 1 Feb 2005
Externally publishedYes

Fingerprint

Dive into the research topics of 'Time-dependent current-voltage relation in electron guns'. Together they form a unique fingerprint.

Cite this