The work function of doped polyaniline nanoparticles observed by Kelvin probe force microscopy

Jinsung Park; Doyeon Bang; Kuewhan Jang; Seungjoo Haam; Jaemoon Yang; Sungsoo Na

doi:10.1088/0957-4484/23/36/365705

The work function of doped polyaniline nanoparticles observed by Kelvin probe force microscopy

Jinsung Park
, Doyeon Bang
, Kuewhan Jang
, Seungjoo Haam
, Jaemoon Yang
, Sungsoo Na

Korea University
Yonsei University

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be ∼270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.

Original language	English
Article number	365705
Journal	Nanotechnology
Volume	23
Issue number	36
DOIs	https://doi.org/10.1088/0957-4484/23/36/365705
State	Published - 14 Sep 2012
Externally published	Yes

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abstract = "The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be ∼270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.",

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AU - Park, Jinsung

AU - Bang, Doyeon

AU - Jang, Kuewhan

AU - Haam, Seungjoo

AU - Yang, Jaemoon

AU - Na, Sungsoo

PY - 2012/9/14

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N2 - The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be ∼270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.

AB - The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be ∼270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.

UR - https://www.scopus.com/pages/publications/84865420386

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VL - 23

JO - Nanotechnology

JF - Nanotechnology

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ER -

The work function of doped polyaniline nanoparticles observed by Kelvin probe force microscopy

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