The effects of a double layer anti-reflection coating for a buried contact solar cell application

I. Lee; D. G. Lim; S. H. Lee; J. Yi

doi:10.1016/S0257-8972(00)01076-8

The effects of a double layer anti-reflection coating for a buried contact solar cell application

I. Lee
, D. G. Lim
, S. H. Lee
, J. Yi

Department of Electronic and Electrical Engineering

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

Abstract

Theoretical and experimental investigations were performed on a double layer anti-reflection (DLAR) coating of MgF₂/CeO₂. We investigated CeO₂ films as an AR layer because they have a proper refractive index of 2.46 and demonstrate the same lattice constant as the Si substrate. An optimized DLAR coating showed a reflectance value as low as 1.87% over wavelengths ranging from 0.4 to 1.1μm. Buried contact solar cells (BCSC) were investigated using the following structure: MgF₂/CeO₂/Ag/Cu/Ni grid/n⁺ emitter/p-type Si base/P⁺/Al. The BCSC efficiency under an illumination of 50 mW/cm² measured as high as 19.9% when employing DLAR coatings. MgF₂/CeO₂ DLAR coatings on the BCSC cell contributed to an increase of the fill factor (from 71% to 75%) and the J_sc (from 19.8 mA/cm² to 22.6 mA/cm²).

Original language	English
Pages (from-to)	86-91
Number of pages	6
Journal	Surface and Coatings Technology
Volume	137
Issue number	1
DOIs	https://doi.org/10.1016/S0257-8972(00)01076-8
State	Published - 2001

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

Keywords

Anti-reflection
Buried contact solar cell
Silicon
Thin film

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10.1016/S0257-8972(00)01076-8

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@article{d6849d64a3914ead82b293a2dddac133,

title = "The effects of a double layer anti-reflection coating for a buried contact solar cell application",

abstract = "Theoretical and experimental investigations were performed on a double layer anti-reflection (DLAR) coating of MgF2/CeO2. We investigated CeO2 films as an AR layer because they have a proper refractive index of 2.46 and demonstrate the same lattice constant as the Si substrate. An optimized DLAR coating showed a reflectance value as low as 1.87\% over wavelengths ranging from 0.4 to 1.1μm. Buried contact solar cells (BCSC) were investigated using the following structure: MgF2/CeO2/Ag/Cu/Ni grid/n+ emitter/p-type Si base/P+/Al. The BCSC efficiency under an illumination of 50 mW/cm2 measured as high as 19.9\% when employing DLAR coatings. MgF2/CeO2 DLAR coatings on the BCSC cell contributed to an increase of the fill factor (from 71\% to 75\%) and the Jsc (from 19.8 mA/cm2 to 22.6 mA/cm2).",

keywords = "Anti-reflection, Buried contact solar cell, Silicon, Thin film",

author = "I. Lee and Lim, \{D. G.\} and Lee, \{S. H.\} and J. Yi",

year = "2001",

doi = "10.1016/S0257-8972(00)01076-8",

language = "English",

volume = "137",

pages = "86--91",

journal = "Surface and Coatings Technology",

issn = "0257-8972",

publisher = "Elsevier B.V.",

number = "1",

}

TY - JOUR

T1 - The effects of a double layer anti-reflection coating for a buried contact solar cell application

AU - Lee, I.

AU - Lim, D. G.

AU - Lee, S. H.

AU - Yi, J.

PY - 2001

Y1 - 2001

N2 - Theoretical and experimental investigations were performed on a double layer anti-reflection (DLAR) coating of MgF2/CeO2. We investigated CeO2 films as an AR layer because they have a proper refractive index of 2.46 and demonstrate the same lattice constant as the Si substrate. An optimized DLAR coating showed a reflectance value as low as 1.87% over wavelengths ranging from 0.4 to 1.1μm. Buried contact solar cells (BCSC) were investigated using the following structure: MgF2/CeO2/Ag/Cu/Ni grid/n+ emitter/p-type Si base/P+/Al. The BCSC efficiency under an illumination of 50 mW/cm2 measured as high as 19.9% when employing DLAR coatings. MgF2/CeO2 DLAR coatings on the BCSC cell contributed to an increase of the fill factor (from 71% to 75%) and the Jsc (from 19.8 mA/cm2 to 22.6 mA/cm2).

AB - Theoretical and experimental investigations were performed on a double layer anti-reflection (DLAR) coating of MgF2/CeO2. We investigated CeO2 films as an AR layer because they have a proper refractive index of 2.46 and demonstrate the same lattice constant as the Si substrate. An optimized DLAR coating showed a reflectance value as low as 1.87% over wavelengths ranging from 0.4 to 1.1μm. Buried contact solar cells (BCSC) were investigated using the following structure: MgF2/CeO2/Ag/Cu/Ni grid/n+ emitter/p-type Si base/P+/Al. The BCSC efficiency under an illumination of 50 mW/cm2 measured as high as 19.9% when employing DLAR coatings. MgF2/CeO2 DLAR coatings on the BCSC cell contributed to an increase of the fill factor (from 71% to 75%) and the Jsc (from 19.8 mA/cm2 to 22.6 mA/cm2).

KW - Anti-reflection

KW - Buried contact solar cell

KW - Silicon

KW - Thin film

UR - https://www.scopus.com/pages/publications/0035061915

U2 - 10.1016/S0257-8972(00)01076-8

DO - 10.1016/S0257-8972(00)01076-8

M3 - Article

AN - SCOPUS:0035061915

SN - 0257-8972

VL - 137

SP - 86

EP - 91

JO - Surface and Coatings Technology

JF - Surface and Coatings Technology

IS - 1

ER -

The effects of a double layer anti-reflection coating for a buried contact solar cell application

Abstract

UN SDGs

Keywords

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