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The effect of AlN and flux addition on luminescence properties of Ce doped TAG phosphor for white light emitting diodes

  • T. Y. Choi
  • , Y. H. Song
  • , H. R. Lee
  • , K. Senthil
  • , T. Masaki
  • , D. H. Yoon
  • Sungkyunkwan University

Research output: Contribution to journalArticlepeer-review

Abstract

A series of Ce3+-activated Tb3Al5O 12 green-yellow phosphors were synthesized using solid state reaction method. The X-ray diffraction peaks of the synthesized phosphor were well matched to the Tb3Al5O12 reference peak data. As the addition amount of AlN increase, the relative intensity of diffraction peak increase. But, the addition amount of AlN is over 0.3 mol, the second phase TbAlO3 diffraction peaks increase. When the addition amount of AlN is 0.3 mol, PL shows the highest emission efficiency. These results were explained by the reducing atmosphere made using AlN. The highest emission intensity was observed when the Ce3+ concentration is 0.25 mol. The emission intensity of the Tb2.75Al5O12:Ce 0.253+ phosphors were increased by adding BaF2 and KNO3 as a flux. The yellow emitting Tb3Al 5O12:Ce3+ phosphors obtained could be applied as white LEDs.

Original languageEnglish
Pages (from-to)500-503
Number of pages4
JournalMaterials Science and Engineering B
Volume177
Issue number7
DOIs
StatePublished - 25 Apr 2012

Keywords

  • Optical materials
  • Photoluminescence
  • X-ray diffraction

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