Temperature-Dependent Electrical Characterization of Amorphous Indium Zinc Oxide Thin-Film Transistors
- Keun Heo
- , Kyung Sang Cho
- , Jun Young Choi
- , Sangmin Han
- , Yun Seop Yu
- , Yonmook Park
- , Gwangwe Yoo
- , Jin Hong Park
- , Sung Woo Hwang
- , Sang Yeol Lee
- Korea University
- Research Center for Time-Domain Nano-Functional Device
- Samsung
- Cheongju University
- Hankyong National University
- Minds Lab
- Sungkyunkwan University
Research output: Contribution to journal › Article › peer-review
8
Link opens in a new tab
Scopus
citations