Abstract
We characterized the electrical behavior of crystalline silicon (c-Si) and Cu(In1-xGax)Se2 (CIGS) solar cells by current-voltage (I-V) and capacitance-voltage (C-V) methods. We investigated the temperature-dependent carrier transport mechanism by determining the parameters of ideality factor (n) and activation energy (Ea) deduced from I-V measurements. CIGS solar cells, as a function of temperature, showed drastic changes in n and Ea in the space charge region (SCR) that forms near the ZnS/CIGS interface. Furthermore, by using a C-V measured substrate doping profiling method, we confirmed that the CIGS absorption layer had a graded band-gap structure from the end point of the SCR to the CIGS/Mo back contacts, while c-Si solar cells had a uniformly doped carrier concentration.
| Original language | English |
|---|---|
| Pages (from-to) | 9206-9209 |
| Number of pages | 4 |
| Journal | Journal of Nanoscience and Nanotechnology |
| Volume | 14 |
| Issue number | 12 |
| DOIs | |
| State | Published - 1 Dec 2014 |
Keywords
- C-Si Solar Cell
- C-V
- CIGS
- Electrical Characterization
- I-V