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Task Discrepancy Maximization for Fine-grained Few-Shot Classification

  • Sungkyunkwan University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Recognizing discriminative details such as eyes and beaks is important for distinguishing fine-grained classes since they have similar overall appearances. In this regard, we introduce Task Discrepancy Maximization (TDM), a simple module for fine-grained few-shot classification. Our objective is to localize the class-wise discriminative regions by highlighting channels encoding distinct information of the class. Specifically, TDM learns task-specific channel weights based on two novel components: Support Attention Module (SAM) and Query Attention Module (QAM). SAM produces a support weight to represent channel-wise discriminative power for each class. Still, since the SAM is basically only based on the labeled support sets, it can be vulnerable to bias toward such support set. Therefore, we propose QAM which complements SAM by yielding a query weight that grants more weight to object-relevant channels for a given query image. By combining these two weights, a class-wise task-specific channel weight is defined. The weights are then applied to produce task-adaptive feature maps more focusing on the discriminative details. Our experiments validate the effectiveness of TDM and its complementary benefits with prior methods in fine- grained few-shot classification.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
PublisherIEEE Computer Society
Pages5321-5330
Number of pages10
ISBN (Electronic)9781665469463
DOIs
StatePublished - 2022
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022 - New Orleans, United States
Duration: 19 Jun 202224 Jun 2022

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2022-June
ISSN (Print)1063-6919

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
Country/TerritoryUnited States
CityNew Orleans
Period19/06/2224/06/22

Keywords

  • categorization
  • Recognition: detection
  • retrieval
  • Self-& semi-& meta- & unsupervised learning

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