Abstract
The enhanced blue emission of Eu 2+-doped GaN/SiO 2 nanocomposites prepared through the nitridation process in an Ar environment containing 5% H 2 and NH 3 gas at 1000°C was investigated as a function of the amount of SiO 2 nanoparticles added. The X-ray diffraction patterns indicate that the Eu 2+-doped GaN/SiO 2 nanocomposites consisted of a powder mixture of Eu 2+-doped GaN and amorphous SiO 2 particles. The back-scattering electron image and mapping data indicate that the SiO 2 nanoparticles enclose the Eu 2+-doped GaN nanoparticles to form aggregates. The red shifted peaks for the Ga-N bonds observed in the Fourier transform infrared spectra were attributed to the formation of GaO xN y and GaN intermediates. Strong emission and shoulder peaks of the Eu 2+-doped GaN/SiO 2 nanocomposites were observed at around 470 nm and 450 nm upon the addition of SiO 2, respectively. The Eu 2+-doped GaN/SiO 2 nanocomposites showed the highest blue emission intensity at 0.15 mol% of SiO 2 nanoparticles.
| Original language | English |
|---|---|
| Pages (from-to) | 170-172 |
| Number of pages | 3 |
| Journal | Materials Letters |
| Volume | 79 |
| DOIs | |
| State | Published - 15 Jul 2012 |
Keywords
- FTIR
- Luminescence
- Nanocomposites
- Semiconductors