Surface roughness factor of anodic oxide layer for electrolytic capacitors

Han Jun Oh; Gyeong Su Park; Jung Gu Kim; Yongsoo Jeong; Choong Soo Chi

doi:10.1016/S0254-0584(03)00139-1

Surface roughness factor of anodic oxide layer for electrolytic capacitors

Han Jun Oh
, Gyeong Su Park
, Jung Gu Kim
, Yongsoo Jeong
, Choong Soo Chi

Department of Advanced Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

The roughness factor of barrier-type anodic oxide layer with low electrical conductivity was evaluated using electrochemical measurement in electrolyte with redox couple. To evaluate the surface roughness factor, the surface of barrier-type oxide layer was covered with thin layer of platinum by sputtering. From the limiting diffusion current method the surface roughness factor of barrier-type Al₂O₃ estimated to be 1.03. This factor is in good agreement with the results of the cross-sectional characteristics by using transmission electron microscope.

Original language	English
Pages (from-to)	331-334
Number of pages	4
Journal	Materials Chemistry and Physics
Volume	82
Issue number	2
DOIs	https://doi.org/10.1016/S0254-0584(03)00139-1
State	Published - 15 Nov 2003

Keywords

Aluminum oxide
Capacitance
Dielectric properties
Electrochemical techniques

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10.1016/S0254-0584(03)00139-1

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title = "Surface roughness factor of anodic oxide layer for electrolytic capacitors",

abstract = "The roughness factor of barrier-type anodic oxide layer with low electrical conductivity was evaluated using electrochemical measurement in electrolyte with redox couple. To evaluate the surface roughness factor, the surface of barrier-type oxide layer was covered with thin layer of platinum by sputtering. From the limiting diffusion current method the surface roughness factor of barrier-type Al2O3 estimated to be 1.03. This factor is in good agreement with the results of the cross-sectional characteristics by using transmission electron microscope.",

keywords = "Aluminum oxide, Capacitance, Dielectric properties, Electrochemical techniques",

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T1 - Surface roughness factor of anodic oxide layer for electrolytic capacitors

AU - Oh, Han Jun

AU - Park, Gyeong Su

AU - Kim, Jung Gu

AU - Jeong, Yongsoo

AU - Chi, Choong Soo

PY - 2003/11/15

Y1 - 2003/11/15

N2 - The roughness factor of barrier-type anodic oxide layer with low electrical conductivity was evaluated using electrochemical measurement in electrolyte with redox couple. To evaluate the surface roughness factor, the surface of barrier-type oxide layer was covered with thin layer of platinum by sputtering. From the limiting diffusion current method the surface roughness factor of barrier-type Al2O3 estimated to be 1.03. This factor is in good agreement with the results of the cross-sectional characteristics by using transmission electron microscope.

AB - The roughness factor of barrier-type anodic oxide layer with low electrical conductivity was evaluated using electrochemical measurement in electrolyte with redox couple. To evaluate the surface roughness factor, the surface of barrier-type oxide layer was covered with thin layer of platinum by sputtering. From the limiting diffusion current method the surface roughness factor of barrier-type Al2O3 estimated to be 1.03. This factor is in good agreement with the results of the cross-sectional characteristics by using transmission electron microscope.

KW - Aluminum oxide

KW - Capacitance

KW - Dielectric properties

KW - Electrochemical techniques

UR - https://www.scopus.com/pages/publications/0043011801

U2 - 10.1016/S0254-0584(03)00139-1

DO - 10.1016/S0254-0584(03)00139-1

M3 - Article

AN - SCOPUS:0043011801

SN - 0254-0584

VL - 82

SP - 331

EP - 334

JO - Materials Chemistry and Physics

JF - Materials Chemistry and Physics

IS - 2

ER -

Surface roughness factor of anodic oxide layer for electrolytic capacitors

Abstract

Keywords

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