Surface potential relaxation of ferroelectric domain investigated by kelvin probe force microscopy

Jiyoon Kim; Yunseok Kim; Kwangsoo No; Simon Bhlmann; Seungbum Hong; Yun Woo Nam; Seung Hyun Kim

doi:10.1080/10584580601085552

Surface potential relaxation of ferroelectric domain investigated by kelvin probe force microscopy

Jiyoon Kim, Yunseok Kim, Kwangsoo No, Simon Bhlmann, Seungbum Hong, Yun Woo Nam, Seung Hyun Kim

Research output: Contribution to journal › Conference article › peer-review

9 Scopus citations

Abstract

We attempted to investigate the surface potential relaxation of ferroelectric thin film domain by using Kelvin probe force microscopy (KFM). To avoid charge suction phenomenon by a grounded tip, the offset voltage was applied to the base line of the pulse trace. It was found that the surface potential contrast decreased in terms of elapsed time. Spreading a charge around domain makes the surface potential contrast decrease. Coulomb force repulsion and retention loss contributed to the spreading of surface charges on the ferroelectric domain. These results help us understand surface potential relaxation of nanoscale ferroelectric domains.

Original language	English
Pages (from-to)	25-30
Number of pages	6
Journal	Integrated Ferroelectrics
Volume	85
Issue number	1
DOIs	https://doi.org/10.1080/10584580601085552
State	Published - 2006
Externally published	Yes
Event	18th International Symposium on Integrated Ferroelectrics (ISIF 2006) - Honolulu, Hawaii, United States Duration: 23 Apr 2006 → 27 Apr 2006

Keywords

Ferroelectric domain
Ferroelectric thin film
Grounded tip effect
KFM
Surface potential relaxation

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10.1080/10584580601085552

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title = "Surface potential relaxation of ferroelectric domain investigated by kelvin probe force microscopy",

abstract = "We attempted to investigate the surface potential relaxation of ferroelectric thin film domain by using Kelvin probe force microscopy (KFM). To avoid charge suction phenomenon by a grounded tip, the offset voltage was applied to the base line of the pulse trace. It was found that the surface potential contrast decreased in terms of elapsed time. Spreading a charge around domain makes the surface potential contrast decrease. Coulomb force repulsion and retention loss contributed to the spreading of surface charges on the ferroelectric domain. These results help us understand surface potential relaxation of nanoscale ferroelectric domains.",

keywords = "Ferroelectric domain, Ferroelectric thin film, Grounded tip effect, KFM, Surface potential relaxation",

author = "Jiyoon Kim and Yunseok Kim and Kwangsoo No and Simon Bhlmann and Seungbum Hong and Nam, \{Yun Woo\} and Kim, \{Seung Hyun\}",

year = "2006",

doi = "10.1080/10584580601085552",

language = "English",

volume = "85",

pages = "25--30",

journal = "Integrated Ferroelectrics",

issn = "1058-4587",

publisher = "Taylor and Francis Ltd.",

number = "1",

note = "18th International Symposium on Integrated Ferroelectrics (ISIF 2006) ; Conference date: 23-04-2006 Through 27-04-2006",

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TY - JOUR

T1 - Surface potential relaxation of ferroelectric domain investigated by kelvin probe force microscopy

AU - Kim, Jiyoon

AU - Kim, Yunseok

AU - No, Kwangsoo

AU - Bhlmann, Simon

AU - Hong, Seungbum

AU - Nam, Yun Woo

AU - Kim, Seung Hyun

PY - 2006

Y1 - 2006

N2 - We attempted to investigate the surface potential relaxation of ferroelectric thin film domain by using Kelvin probe force microscopy (KFM). To avoid charge suction phenomenon by a grounded tip, the offset voltage was applied to the base line of the pulse trace. It was found that the surface potential contrast decreased in terms of elapsed time. Spreading a charge around domain makes the surface potential contrast decrease. Coulomb force repulsion and retention loss contributed to the spreading of surface charges on the ferroelectric domain. These results help us understand surface potential relaxation of nanoscale ferroelectric domains.

AB - We attempted to investigate the surface potential relaxation of ferroelectric thin film domain by using Kelvin probe force microscopy (KFM). To avoid charge suction phenomenon by a grounded tip, the offset voltage was applied to the base line of the pulse trace. It was found that the surface potential contrast decreased in terms of elapsed time. Spreading a charge around domain makes the surface potential contrast decrease. Coulomb force repulsion and retention loss contributed to the spreading of surface charges on the ferroelectric domain. These results help us understand surface potential relaxation of nanoscale ferroelectric domains.

KW - Ferroelectric domain

KW - Ferroelectric thin film

KW - Grounded tip effect

KW - KFM

KW - Surface potential relaxation

UR - https://www.scopus.com/pages/publications/38849176979

U2 - 10.1080/10584580601085552

DO - 10.1080/10584580601085552

M3 - Conference article

AN - SCOPUS:38849176979

SN - 1058-4587

VL - 85

SP - 25

EP - 30

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

IS - 1

T2 - 18th International Symposium on Integrated Ferroelectrics (ISIF 2006)

Y2 - 23 April 2006 through 27 April 2006

ER -

Surface potential relaxation of ferroelectric domain investigated by kelvin probe force microscopy

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Keywords

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