TY - JOUR
T1 - Surface energy-tunable iso decyl acrylate based molds for low pressure-nanoimprint lithography
AU - Tak, Hyowon
AU - Tahk, Dongha
AU - Jeong, Chanho
AU - Lee, Sori
AU - Kim, Tae Il
N1 - Publisher Copyright:
© 2017 IOP Publishing Ltd.
PY - 2017/9/12
Y1 - 2017/9/12
N2 - We presented surface energy-tunable nanoscale molds for unconventional lithography. The mold is highly robust, transparent, has a minimized haze, does not contain additives, and is a non-fluorinated isodecyl acrylate and trimethylolpropane triacrylate based polymer. By changing the mixing ratio of the polymer components, the cross-linking density, mechanical modulus, and surface energy (crucial factors in low pressure ((1-2) × 105 N m-2) low pressure-nanoimprint lithography (LP-NIL)), can be controlled. To verify these properties of the molds, we also characterized the surface energy by measuring the contact angles and calculating the work of adhesion among the wafer, polymer film, and mold for successful demolding in nanoscale structures. Moreover, the molds showed high optical clarity and precisely tunable mechanical and surface properties, capable of replicating sub-100 nm patterns by thermal LP-NIL and UV-NIL.
AB - We presented surface energy-tunable nanoscale molds for unconventional lithography. The mold is highly robust, transparent, has a minimized haze, does not contain additives, and is a non-fluorinated isodecyl acrylate and trimethylolpropane triacrylate based polymer. By changing the mixing ratio of the polymer components, the cross-linking density, mechanical modulus, and surface energy (crucial factors in low pressure ((1-2) × 105 N m-2) low pressure-nanoimprint lithography (LP-NIL)), can be controlled. To verify these properties of the molds, we also characterized the surface energy by measuring the contact angles and calculating the work of adhesion among the wafer, polymer film, and mold for successful demolding in nanoscale structures. Moreover, the molds showed high optical clarity and precisely tunable mechanical and surface properties, capable of replicating sub-100 nm patterns by thermal LP-NIL and UV-NIL.
KW - cross-linking density
KW - haze
KW - low pressure nanoimprint lithography
KW - surface energy
KW - unconventional lithography
UR - https://www.scopus.com/pages/publications/85029513883
U2 - 10.1088/1361-6528/aa8135
DO - 10.1088/1361-6528/aa8135
M3 - Article
C2 - 28727575
AN - SCOPUS:85029513883
SN - 0957-4484
VL - 28
JO - Nanotechnology
JF - Nanotechnology
IS - 40
M1 - 405301
ER -