Abstract
Incorporating UV-sensitive electron transport layers (ETLs) into organic bulk heterojunction (BHJ) photovoltaic devices dramatically impacts short-circuit current (Jsc) and fill factor characteristics. Resistivity changes induced by UV illumination in the ETL of inverted BHJ devices suppress bimolecular recombination producing up to a two orders of magnitude change in Jsc. Electro-optical modeling and light intensity experiments effectively demonstrate that bimolecular recombination, in the form of diode current losses, controls the extracted photocurrent and is directly dependent on the ETL resistivity.
| Original language | English |
|---|---|
| Article number | 083101 |
| Journal | Journal of Applied Physics |
| Volume | 108 |
| Issue number | 8 |
| DOIs | |
| State | Published - 15 Oct 2010 |
| Externally published | Yes |