Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser

S. Puthukodan; E. Dadrasnia; V. K.T. Vinod; H. K. Nguendon; H. Lamela; G. Ducournau; J. F. Lampin; F. Garet; J. L. Coutaz; D. M. Lee; S. Baik

doi:10.1049/el.2013.4136

Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser

S. Puthukodan
, E. Dadrasnia
, V. K.T. Vinod
, H. K. Nguendon
, H. Lamela
, G. Ducournau
, J. F. Lampin
, F. Garet
, J. L. Coutaz
, D. M. Lee
, S. Baik

Department of Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy.

Original language	English
Pages (from-to)	297-299
Number of pages	3
Journal	Electronics Letters
Volume	50
Issue number	4
DOIs	https://doi.org/10.1049/el.2013.4136
State	Published - 13 Feb 2014

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10.1049/el.2013.4136

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title = "Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser",

abstract = "A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy.",

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doi = "10.1049/el.2013.4136",

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AU - Puthukodan, S.

AU - Dadrasnia, E.

AU - Vinod, V. K.T.

AU - Nguendon, H. K.

AU - Lamela, H.

AU - Ducournau, G.

AU - Lampin, J. F.

AU - Garet, F.

AU - Coutaz, J. L.

AU - Lee, D. M.

AU - Baik, S.

PY - 2014/2/13

Y1 - 2014/2/13

N2 - A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy.

AB - A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy.

UR - https://www.scopus.com/pages/publications/84894079739

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DO - 10.1049/el.2013.4136

M3 - Article

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SN - 0013-5194

VL - 50

SP - 297

EP - 299

JO - Electronics Letters

JF - Electronics Letters

IS - 4

ER -

Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser

Abstract

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