@inproceedings{e0dae0b651f24976a96db73ee57c0406,
title = "STT-MRAM Read and Write Circuit for High Reliability and Power Efficiency",
abstract = "This paper proposes a circuit design that can improve reliability while reducing write power consumption. This circuit performs a rewrite operation if the write fails after the write operation. We can reduce power consumption by lowering the initial write current. Verification and rewrite operations improve circuit reliability by reducing the write error.",
keywords = "read-write circuit, reliability, STT-MRAM",
author = "Yun, \{Dong Kil\} and Chun, \{Jung Hoon\}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 19th International System-on-Chip Design Conference, ISOCC 2022 ; Conference date: 19-10-2022 Through 22-10-2022",
year = "2022",
doi = "10.1109/ISOCC56007.2022.10031601",
language = "English",
series = "Proceedings - International SoC Design Conference 2022, ISOCC 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "290--291",
booktitle = "Proceedings - International SoC Design Conference 2022, ISOCC 2022",
}