Abstract
We investigated the structural and optical properties of InGaN/GaN triangular-shaped multiple quantum well (MQW) structures as a function of emission wavelengths. As the peak wavelength became longer, the average In composition increased linearly and the peak linewidth in the PL measurements became broad. Also, the PL intensity showed the highest value at 23% In and the interface showed the best abruptness, but the lowest intensity at 30% In. A decrease in emission intensity is ascribed to the crystalline imperfection such as defects and/or impurities caused by increased misfit strain in the QW regions with relatively higher In composition.
| Original language | English |
|---|---|
| Pages (from-to) | 2703-2706 |
| Number of pages | 4 |
| Journal | Physica Status Solidi C: Conferences |
| Issue number | 7 |
| DOIs | |
| State | Published - 2003 |
| Externally published | Yes |
| Event | 5th International Conference on Nitride Semiconductors, ICNS 2003 - Nara, Japan Duration: 25 May 2003 → 30 May 2003 |
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