Abstract
In this letter, Cd1-x-yZnxCuySe (0.025 ≤ x = y ≤ 0.15) thin films were deposited by a chemical route. As-deposited thin films were characterized for the structural, morphological compositional and optoelectronic studies. X-ray diffraction confirmed the formation of polycrystalline thin films with a mixed crystal structure. Compositional analysis indicated the substitution of Cd2+ ions by Zn2+ and Cu2+. As-grown semiconductor thin films revealed p-type conductivity with a high absorption coefficient (≈105 cm−1). The energy bandgap was modified from 2.09 eV to 2.33 eV by Zn and Cu addition into the CdSe host.
| Original language | English |
|---|---|
| Article number | 136990 |
| Journal | Chemical Physics Letters |
| Volume | 739 |
| DOIs | |
| State | Published - Jan 2020 |
Keywords
- Bandgap
- Chalcogenide
- Hall effect
- XRD