Abstract
We investigated spatial light emission from a periodic inverted polygonal deflector, which included six {10-1-1} facets and six {11-2-2} facets embedded in an InGaNGaN light emitting diode by using confocal scanning electroluminescence microscopy. We found a noticeable crown shape with the contrast of luminescence intensity and wavelength observed on these facets mainly due to the variation of growth rate for the InGaN quantum wells. In addition, a very low intensity and blueshifted emission wavelength on the {11-2-2} facets indicated the deficiency of indium incorporation and/or much thinner well thickness as compared to that of the {10-1-1} facets.
| Original language | English |
|---|---|
| Article number | 061118 |
| Journal | Applied Physics Letters |
| Volume | 92 |
| Issue number | 6 |
| DOIs | |
| State | Published - 2008 |
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