Abstract
MgTiO3 thin films have been successfully grown on a sapphire crystal by the sol-gel process. Epitaxial growth of MgTiO3 thin films was obtained using magnesium acetylacetonate and titanium isopropoxide in the sol-gel process. In nonhydrolytic conditions, the c-axis oriented ilmenite structure of MgTiO3 thin films developed at the crystallization temperatures 650-800 °C with a 3-fold axis symmetry in the c-plane. These epitaxial MgTiO3 thin films had extremely fine features in morphology, i.e., a fine grain size of 10-20 nm and a very smooth surface of 0.9 nm rms roughness. The epitaxial MgTiO3 thin films exhibited a UV absorption edge at 280 nm and were transparent in the wavelength range of 400-1100 nm. The ordinary refractive index of the epitaxially grown MgTiO3 thin films was 2.305, very close to the value of single-crystal MgTiO3. This suggests that the epitaxially grown MgTiO3 thin films are well crystallized and sufficiently strain-relaxed due to the small lattice mismatch with Al2O3 substrate.
| Original language | English |
|---|---|
| Pages (from-to) | 3651-3654 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 38 |
| Issue number | 6 A |
| DOIs | |
| State | Published - Jun 1999 |
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