Abstract
Following the need to accurately understand the In composition fluctuations and their role on the optical properties of the GaN based heterostructures, an investigation of MOCVD InGaN/GaN quantum wells is carried out. To this end, quantitative High Resolution Transmission Electron Microscopy (HRTEM) is coupled with image simulation and Finite Element Method (FEM) for the thin foil relaxation modelling. The results show that the indium content can reach x = 1 in the clusters inside the core. In these MOCVD QWs, we attempt to connect the Quantum dot density, composition, and shape to the growth conditions, in order to help the engineering process of highly efficient devices.
| Original language | English |
|---|---|
| Pages (from-to) | 2381-2384 |
| Number of pages | 4 |
| Journal | Physica Status Solidi C: Conferences |
| Volume | 2 |
| Issue number | 7 |
| DOIs | |
| State | Published - 2005 |
| Externally published | Yes |
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