Single-Scan monochromatic photonic capacitance-voltage technique for extraction of subgap dos over the bandgap in amorphous semiconductor tfts
- Hagyoul Bae
- , Hyunjun Choi
- , Sungwoo Jun
- , Chunhyung Jo
- , Yun Hyeok Kim
- , Jun Seok Hwang
- , Jaeyeop Ahn
- , Saeroonter Oh
- , Jong Uk Bae
- , Sung Jin Choi
- , Dae Hwan Kim
- , Dong Myong Kim
Research output: Contribution to journal › Article › peer-review
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