@inproceedings{85428595159243db86bbfd7ca93dada5,
title = "Set level at speed HTOL test for reliability qualification of high speed mobile applications",
abstract = "Similar to At Speed HTOL (ASH) [1], the study of Vmin-shift induced failure on Application Processor (AP) is stretched to the 'set level' stress test. The set level test enables to filter out unscreened functional or power related early fails particularly with high frequency and heavy duty scenario-based software test and as a result, field failure rate is significantly reduced. We'll discuss the system level stress tests and its perspective as the current and future qualification required for new product introduction of high speed mobile applications.",
keywords = "AP processor, at speed HTOL, field failure ratel, High-k, reliability qualification, Set level test, Vmin",
author = "Jongwoo Park and Wooyeon Kim and Taeyong Lee and Donghee Lee and Jeongsik Lim and Jiheon Jeong and Yunhwan Kim and Kyongtaek Lee and Joungsu Ryu and Shin, \{Sang Chul\} and Hyunjo Shin and Sangwoo Pae",
year = "2014",
doi = "10.1109/IRPS.2014.6861170",
language = "English",
isbn = "9781479933167",
series = "IEEE International Reliability Physics Symposium Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "PR.3.1--PR.3.3",
booktitle = "2014 IEEE International Reliability Physics Symposium, IRPS 2014",
note = "52nd IEEE International Reliability Physics Symposium, IRPS 2014 ; Conference date: 01-06-2014 Through 05-06-2014",
}