Abstract
Seed layer repairing, a complementary technology to the fabrication of continuous Cu seed layers for acid Cu superfilling, was carried out in alkaline pyrophosphate solution by modified two-step electrodeposition. A short potential pulse was applied for nucleation prior to the second step, which was application of a lower potential for growth. This technique increased the surface coverage of damaged Cu seed layers from 78.10% to 99.46%. It was also shown to have the ability to repair an artificially damaged Cu seed layer with a 55 nm wide trench and to guarantee successful filling performance.
| Original language | English |
|---|---|
| Pages (from-to) | D202-D205 |
| Journal | Journal of the Electrochemical Society |
| Volume | 160 |
| Issue number | 4 |
| DOIs | |
| State | Published - 2013 |
| Externally published | Yes |