Screen charge transfer by grounded tip on ferroelectric surfaces

Yunseok Kim; Jiyoon Kim; Simon Bühlmann; Seungbum Hong; Yong Kwan Kim; Seung Hyun Kim; Kwangsoo No

doi:10.1002/pssr.200701265

Screen charge transfer by grounded tip on ferroelectric surfaces

Yunseok Kim, Jiyoon Kim, Simon Bühlmann, Seungbum Hong, Yong Kwan Kim, Seung Hyun Kim, Kwangsoo No

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage.

Original language	English
Pages (from-to)	74-76
Number of pages	3
Journal	Physica Status Solidi - Rapid Research Letters
Volume	2
Issue number	2
DOIs	https://doi.org/10.1002/pssr.200701265
State	Published - 2008
Externally published	Yes

Access to Document

10.1002/pssr.200701265

Cite this

@article{f2daa615bade4790b73f377169d7ab8a,

title = "Screen charge transfer by grounded tip on ferroelectric surfaces",

abstract = "We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage.",

author = "Yunseok Kim and Jiyoon Kim and Simon B{\"u}hlmann and Seungbum Hong and Kim, \{Yong Kwan\} and Kim, \{Seung Hyun\} and Kwangsoo No",

year = "2008",

doi = "10.1002/pssr.200701265",

language = "English",

volume = "2",

pages = "74--76",

journal = "Physica Status Solidi - Rapid Research Letters",

issn = "1862-6254",

publisher = "Wiley-VCH Verlag",

number = "2",

}

TY - JOUR

T1 - Screen charge transfer by grounded tip on ferroelectric surfaces

AU - Kim, Yunseok

AU - Kim, Jiyoon

AU - Bühlmann, Simon

AU - Hong, Seungbum

AU - Kim, Yong Kwan

AU - Kim, Seung Hyun

AU - No, Kwangsoo

PY - 2008

Y1 - 2008

N2 - We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage.

AB - We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage.

UR - https://www.scopus.com/pages/publications/58849160808

U2 - 10.1002/pssr.200701265

DO - 10.1002/pssr.200701265

M3 - Article

AN - SCOPUS:58849160808

SN - 1862-6254

VL - 2

SP - 74

EP - 76

JO - Physica Status Solidi - Rapid Research Letters

JF - Physica Status Solidi - Rapid Research Letters

IS - 2

ER -

Screen charge transfer by grounded tip on ferroelectric surfaces

Abstract

Access to Document

Other files and links

Fingerprint

Cite this