Abstract
In this paper, we propose a scan driver circuit with two outputs employing low-temperature polycrystalline silicon and oxide (LTPO) thin-film transistors (TFTs). The proposed scan driver circuit can generate two types of scan signals that can drive p type and n-type switching TFTs. In addition, by using the Q[n] node bootstrapping method, the output is stably generated even in the depletion mode of the amorphous indium-gallium-zinc oxide (a-IGZO) TFTs. As it is a scan driver circuit that can be applied to LTPO TFT-based pixel circuits, variable refresh rate operation is possible. Therefore, the proposed scan driver circuit can be applied to displays requiring high resolution, narrow bezel, and low power consumption.
| Original language | English |
|---|---|
| Pages (from-to) | 1491-1494 |
| Number of pages | 4 |
| Journal | Digest of Technical Papers - SID International Symposium |
| Volume | 54 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2023 |
| Externally published | Yes |
| Event | SID International Symposium Digest of Technical Papers, 2023 - Los Angeles, United States Duration: 21 May 2023 → 26 May 2023 |
Keywords
- low-temperature polycrystalline silicon and oxide (LTPO)
- scan driver circuit
- thin-film transistor
- variable refresh rate