Robust 1/f Noise Unaffected by Program/Erase Cycling-Induced Damage in Ferroelectric Schottky Barrier FETs
- Wonjun Shin
- , Ryun Han Koo
- , Sangwoo Kim
- , Dongseok Kwon
- , Jae Joon Kim
- , Daewoong Kwon
- , Jong Ho Lee
- Sungkyunkwan University
- Hanyang University
Research output: Contribution to journal › Article › peer-review
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