TY - GEN
T1 - RF ESD protection strategies
T2 - 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005
AU - Soldner, W.
AU - Streibl, M.
AU - Hodel, U.
AU - Tiebout, M.
AU - Gossner, H.
AU - Schmitt-Landsiedel, D.
AU - Chun, J. H.
AU - Ito, C.
AU - Dutton, R. W.
PY - 2005
Y1 - 2005
N2 - The present work is focussed on the trade off between conventional RF ESD protection concepts optimized in terms of capacitive load and the frequently discussed RF ESD codesign idea with ESD protection skilfully integrated into RF circuit design. A narrow and a broadband RF test circuit were developed to put the benchmark on a firm basis. RF and ESD experiments are discussed, showing where the higher effort for the codesign approach starts to pay off. Copyright 2005
AB - The present work is focussed on the trade off between conventional RF ESD protection concepts optimized in terms of capacitive load and the frequently discussed RF ESD codesign idea with ESD protection skilfully integrated into RF circuit design. A narrow and a broadband RF test circuit were developed to put the benchmark on a firm basis. RF and ESD experiments are discussed, showing where the higher effort for the codesign approach starts to pay off. Copyright 2005
UR - https://www.scopus.com/pages/publications/70449723038
M3 - Conference contribution
AN - SCOPUS:70449723038
SN - 158537069X
SN - 9781585370696
T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
BT - 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005
Y2 - 8 September 2005 through 16 September 2005
ER -