Reliability estimation of the accelerated life test for CRTs with the oxide-coated cathode

Byung Mook Weon; Gong Seog Park; Won Hyun Kim

Reliability estimation of the accelerated life test for CRTs with the oxide-coated cathode

Byung Mook Weon
, Gong Seog Park
, Won Hyun Kim

Koninklijke Philips N.V.

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

Reliability estimation of the accelerated life test for cathode ray tubes (CRT) was discussed. CRTs with the oxide-coated cathode were investigated. Results showed that the degradation rate depends on the temperature, the higher the temperature the faster the degradation.

Original language	English
Pages (from-to)	699-702
Number of pages	4
Journal	SID Conference Record of the International Display Research Conference
State	Published - 2001
Externally published	Yes
Event	Asia Display/IDW 2001 - Nagoya, Japan Duration: 16 Oct 2002 → 19 Oct 2002

Keywords

Accelerated Life Test
Reliability
Weibull

Cite this

@article{06e3c2a120bb48f29b7a88510c46c330,

title = "Reliability estimation of the accelerated life test for CRTs with the oxide-coated cathode",

abstract = "Reliability estimation of the accelerated life test for cathode ray tubes (CRT) was discussed. CRTs with the oxide-coated cathode were investigated. Results showed that the degradation rate depends on the temperature, the higher the temperature the faster the degradation.",

keywords = "Accelerated Life Test, Reliability, Weibull",

author = "Weon, \{Byung Mook\} and Park, \{Gong Seog\} and Kim, \{Won Hyun\}",

year = "2001",

language = "English",

pages = "699--702",

journal = "SID Conference Record of the International Display Research Conference",

issn = "1083-1312",

publisher = "Society for Information Display",

note = "Asia Display/IDW 2001 ; Conference date: 16-10-2002 Through 19-10-2002",

}

TY - JOUR

T1 - Reliability estimation of the accelerated life test for CRTs with the oxide-coated cathode

AU - Weon, Byung Mook

AU - Park, Gong Seog

AU - Kim, Won Hyun

PY - 2001

Y1 - 2001

N2 - Reliability estimation of the accelerated life test for cathode ray tubes (CRT) was discussed. CRTs with the oxide-coated cathode were investigated. Results showed that the degradation rate depends on the temperature, the higher the temperature the faster the degradation.

AB - Reliability estimation of the accelerated life test for cathode ray tubes (CRT) was discussed. CRTs with the oxide-coated cathode were investigated. Results showed that the degradation rate depends on the temperature, the higher the temperature the faster the degradation.

KW - Accelerated Life Test

KW - Reliability

KW - Weibull

UR - https://www.scopus.com/pages/publications/0035782610

M3 - Conference article

AN - SCOPUS:0035782610

SN - 1083-1312

SP - 699

EP - 702

JO - SID Conference Record of the International Display Research Conference

JF - SID Conference Record of the International Display Research Conference

T2 - Asia Display/IDW 2001

Y2 - 16 October 2002 through 19 October 2002

ER -

Reliability estimation of the accelerated life test for CRTs with the oxide-coated cathode

Abstract

Keywords

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