Regularization with multiple feature combination for few-shot learning

  • Su Been Lee
  • , Jun Ho Park
  • , Ji Young Kim
  • , Seung Yeol Lee
  • , Jae Pil Heo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Few-shot learning solves problems with a limited amount of labeled examples. Our analysis shows the existing metric-based methods concentrate on highly discriminative features while not fully utilizing whole capacity. In this work, we propose a novel regularization technique that constrains the model to exploit whole capacity by distinguishing data with multiple feature combinations. Our approach achieves state-of the-art performance in several public benchmarks compared to the existing metric-based methods.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE International Conference on Big Data and Smart Computing, BigComp 2021
EditorsHerwig Unger, Jinho Kim, U Kang, Chakchai So-In, Junping Du, Walid Saad, Young-guk Ha, Christian Wagner, Julien Bourgeois, Chanboon Sathitwiriyawong, Hyuk-Yoon Kwon, Carson Leung
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages334-337
Number of pages4
ISBN (Electronic)9781728189246
DOIs
StatePublished - Jan 2021
Event2021 IEEE International Conference on Big Data and Smart Computing, BigComp 2021 - Jeju Island, Korea, Republic of
Duration: 17 Jan 202120 Jan 2021

Publication series

NameProceedings - 2021 IEEE International Conference on Big Data and Smart Computing, BigComp 2021

Conference

Conference2021 IEEE International Conference on Big Data and Smart Computing, BigComp 2021
Country/TerritoryKorea, Republic of
CityJeju Island
Period17/01/2120/01/21

Keywords

  • Few-shot learning
  • Metric-based method
  • Regularization

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