Random and localized resistive switching observation in Pt/NiO/Pt
- Jung Bin Yun
- , Sejin Kim
- , Sunae Seo
- , Myoung Jae Lee
- , Dong Chul Kim
- , Seung Eon Ahn
- , Yongsoo Park
- , Jiyoung Kim
- , Hyunjung Shin
- Kookmin University
- Samsung
- University of Texas at Dallas
Research output: Contribution to journal › Article › peer-review
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