Abstract
Boron-doped CdS thin films were chemically deposited onto glass substrates. X-Ray diffraction (XRD), photoluminescence (PL), and Raman techniques were used to evaluate the quality of B-doped CdS films. XRD results have confirmed that B-doped CdS films have a hexagonal structure with a preferential orientation of the (002) plane. The grain size of B-doped CdS films slightly decreases, but no change of the microstructure was observed. The PL spectra for all samples consist of two prominent broad bands approximately 2.3 eV (green emission) and 1.6 eV (red emission) and the higher doping concentrations gradually decreased the green emission and red emission. Raman analysis has shown that undoped films have structure superior to those of B-doped CdS films.
| Original language | English |
|---|---|
| Pages (from-to) | 170-174 |
| Number of pages | 5 |
| Journal | Thin Solid Films |
| Volume | 451-452 |
| DOIs | |
| State | Published - 22 Mar 2004 |
| Externally published | Yes |
| Event | Proceedings of Symposium D on Thin Film and Nano-Structured - Strasbourg, France Duration: 10 Jun 2003 → 13 Jun 2003 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- Boron
- Cadmium sulfide
- Raman scattering
- Solar cells
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