Quantitative evaluation of the atomic structure of defects and composition fluctuations at the nanometer scale inside InGaN/GaN heterostructures
- R. Ruterana
- , P. Singh
- , S. Kret
- , G. Jurczak
- , G. Maciejewski
- , P. Dluzewski
- , H. K. Cho
- , R. J. Choi
- , H. J. Lee
- , E. K. Suh
- CNRS
- Institute of Physics of the Polish Academy of Sciences
- Institute of Fundamental Technological Research of the Polish Academy of Sciences
- Dong-A University
- Jeonbuk National University
Research output: Contribution to journal › Article › peer-review
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