TY - JOUR
T1 - Properties and applications of a modified dielectric barrier discharge generated at atmospheric pressure
AU - Lee, Yong Hyuk
AU - Yeom, Geun Young
PY - 2005/2
Y1 - 2005/2
N2 - An atmospheric pressure plasma was generated using a modified dielectric barrier discharge with the power electrode composed of multi-pins (i.e., a pin-to-plate type) instead of a conventional blank plate (i.e., a DBD-type), and the discharge and the photoresist etching characteristics were compared with those produced by the DBD-type at various He/O2 mixtures. The pin-to-plate type showed a higher discharge current and a higher power consumption than the DBD-type at a given voltage. Therefore, the pin-to-plate type appeared to be more efficient than the conventional DBD-type. In addition, when the photoresist etch rate was examined, the pin-to-plate showed higher etch rates than the DBD-type at various He/O2 mixtures. For the He/O2 mixture, both types showed the maximum photoresist etch rate at a certain He/O2 mixture. Using a gas mixture of 3 slm of O 2 and 10 slm of He, a maximum photoresist etch rate of 340 nm/min and 260 nm/min could be obtained using the pin-to-plate type and the DBD-type, respectively, at 10 kV AC for an electrode size of 500mm × 50mm. No physical damage was observed on the metal lines of the TFT-LCD devices after photoresist etching under the above conditions.
AB - An atmospheric pressure plasma was generated using a modified dielectric barrier discharge with the power electrode composed of multi-pins (i.e., a pin-to-plate type) instead of a conventional blank plate (i.e., a DBD-type), and the discharge and the photoresist etching characteristics were compared with those produced by the DBD-type at various He/O2 mixtures. The pin-to-plate type showed a higher discharge current and a higher power consumption than the DBD-type at a given voltage. Therefore, the pin-to-plate type appeared to be more efficient than the conventional DBD-type. In addition, when the photoresist etch rate was examined, the pin-to-plate showed higher etch rates than the DBD-type at various He/O2 mixtures. For the He/O2 mixture, both types showed the maximum photoresist etch rate at a certain He/O2 mixture. Using a gas mixture of 3 slm of O 2 and 10 slm of He, a maximum photoresist etch rate of 340 nm/min and 260 nm/min could be obtained using the pin-to-plate type and the DBD-type, respectively, at 10 kV AC for an electrode size of 500mm × 50mm. No physical damage was observed on the metal lines of the TFT-LCD devices after photoresist etching under the above conditions.
KW - Atmospheric pressure plasma
KW - DBD
KW - He/O
UR - https://www.scopus.com/pages/publications/17444423287
U2 - 10.1143/JJAP.44.1076
DO - 10.1143/JJAP.44.1076
M3 - Article
AN - SCOPUS:17444423287
SN - 0021-4922
VL - 44
SP - 1076
EP - 1080
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 2
ER -