Skip to main navigation Skip to search Skip to main content

Prediction of Process Variation Effect for Ultrascaled GAA Vertical FET Devices Using a Machine Learning Approach

  • Kyul Ko
  • , Jang Kyu Lee
  • , Myounggon Kang
  • , Jongwook Jeon
  • , Hyungcheol Shin
  • Seoul National University
  • Korea National University of Transportation
  • Konkuk University

Research output: Contribution to journal › Article › peer-review

70   Link opens in a new tab Scopus citations

Fingerprint

Dive into the research topics of 'Prediction of Process Variation Effect for Ultrascaled GAA Vertical FET Devices Using a Machine Learning Approach'. Together they form a unique fingerprint.
Sort by

Computer Science

Chemical Engineering

Material Science

Engineering