Precision ac-dc difference measurements of a thermal transfer standard based on a Josephson sampling voltmeter

  • Mun Seog Kim
  • , Kyu Tae Kim
  • , Wan Seop Kim
  • , Yonuk Chong
  • , Dan Bee Kim
  • , Po Gyu Park
  • , Sung Won Kwon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Progress in the development of an evaluation system for thermal-transfer standard based on a Josephson waveform synthesizer at KRISS. The synthesizer adopting a Josephson junction array, which can generate arbitrary stepwise waveforms with a number of the quantum-voltage steps up to 2.5-V level amplitude. With the synthesizer, we have built a sampling voltmeter that measures the differential voltages between a sinusoidal waveform produced by a semiconductor-based ac source and the Josephson waveforms. We will present in the conference that the developed sampling voltmeter can be utilized as a reference for ac-dc difference measurements of a thermal transfer standard.

Original languageEnglish
Title of host publication2012 Conference on Precision Electromagnetic Measurements, CPEM 2012
Pages534-535
Number of pages2
DOIs
StatePublished - 2012
Externally publishedYes
Event2012 Conference on Precision Electromagnetic Measurements, CPEM 2012 - Washington, DC, United States
Duration: 1 Jul 20126 Jul 2012

Publication series

NameCPEM Digest (Conference on Precision Electromagnetic Measurements)
ISSN (Print)0589-1485

Conference

Conference2012 Conference on Precision Electromagnetic Measurements, CPEM 2012
Country/TerritoryUnited States
CityWashington, DC
Period1/07/126/07/12

Keywords

  • programmable Josephson voltage standard
  • sampling voltmeter
  • thermal transfer standard

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