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p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistor-Based Scan Driver Circuit Capable of Positive and Negative Dual Output Signals

  • Hye Won Woo
  • , Se Hwan Na
  • , Jung Chul Kim
  • , Juhn Suk Yoo
  • , Kook Chul Moon
  • , Hwarim Im
  • , Yong Sang Kim
  • Sungkyunkwan University
  • LG Corporation
  • Konkuk University

Research output: Contribution to journal › Article › peer-review

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