p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistor-Based Scan Driver Circuit Capable of Positive and Negative Dual Output Signals

We propose a scan driver circuit based on p-type low-temperature polycrystalline silicon (LTPS) thin-film transistors (TFTs) capable of positive and negative dual output (PNDO) signals, enabling to activate n-type and p-type TFTs in LTPS and oxide TFT-based pixel circuits. The proposed circuit outputs PNDOs with improved falling characteristics by controlling the output timing and using a bootstrapping method. Power consumption and the circuit area are reduced by generating PNDO signals using a single control part. In addition, the fabricated circuit successfully generated PNDO signals.