P-19: Effect of back channel passivation on the operation stability of solution-processed transparent oxide tfts and ring oscillators

Yong Hoon Kim; Min Suk Oh; Kwang Ho Kim; Hyun Jae Kim; Jeong In Han; Sung Kyu Park

doi:10.1889/1.3621033

P-19: Effect of back channel passivation on the operation stability of solution-processed transparent oxide tfts and ring oscillators

Yong Hoon Kim
, Min Suk Oh
, Kwang Ho Kim
, Hyun Jae Kim
, Jeong In Han
, Sung Kyu Park

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

In this paper, the effects of back channel passivation on the electrical stability of solution-processed zinc-tin-oxide thin-film transistors (ZTO TFTs) and ring oscillators have been investigated. Based on solution-processed ZTO TFTs, ring oscillators with an oscillation frequency up to 769 kHz were realized and it was found that the passivation layer had a strong influence on the operation stability of the ring oscillators.

Original language	English
Pages (from-to)	1166-1169
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	42 1
DOIs	https://doi.org/10.1889/1.3621033
State	Published - Jun 2011
Externally published	Yes

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title = "P-19: Effect of back channel passivation on the operation stability of solution-processed transparent oxide tfts and ring oscillators",

abstract = "In this paper, the effects of back channel passivation on the electrical stability of solution-processed zinc-tin-oxide thin-film transistors (ZTO TFTs) and ring oscillators have been investigated. Based on solution-processed ZTO TFTs, ring oscillators with an oscillation frequency up to 769 kHz were realized and it was found that the passivation layer had a strong influence on the operation stability of the ring oscillators.",

author = "Kim, \{Yong Hoon\} and Oh, \{Min Suk\} and Kim, \{Kwang Ho\} and Kim, \{Hyun Jae\} and Han, \{Jeong In\} and Park, \{Sung Kyu\}",

year = "2011",

month = jun,

doi = "10.1889/1.3621033",

language = "English",

volume = "42 1",

pages = "1166--1169",

journal = "Digest of Technical Papers - SID International Symposium",

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T2 - Effect of back channel passivation on the operation stability of solution-processed transparent oxide tfts and ring oscillators

AU - Kim, Yong Hoon

AU - Oh, Min Suk

AU - Kim, Kwang Ho

AU - Kim, Hyun Jae

AU - Han, Jeong In

AU - Park, Sung Kyu

PY - 2011/6

Y1 - 2011/6

N2 - In this paper, the effects of back channel passivation on the electrical stability of solution-processed zinc-tin-oxide thin-film transistors (ZTO TFTs) and ring oscillators have been investigated. Based on solution-processed ZTO TFTs, ring oscillators with an oscillation frequency up to 769 kHz were realized and it was found that the passivation layer had a strong influence on the operation stability of the ring oscillators.

AB - In this paper, the effects of back channel passivation on the electrical stability of solution-processed zinc-tin-oxide thin-film transistors (ZTO TFTs) and ring oscillators have been investigated. Based on solution-processed ZTO TFTs, ring oscillators with an oscillation frequency up to 769 kHz were realized and it was found that the passivation layer had a strong influence on the operation stability of the ring oscillators.

UR - https://www.scopus.com/pages/publications/84863196434

U2 - 10.1889/1.3621033

DO - 10.1889/1.3621033

M3 - Article

AN - SCOPUS:84863196434

SN - 0097-966X

VL - 42 1

SP - 1166

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JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

ER -

P-19: Effect of back channel passivation on the operation stability of solution-processed transparent oxide tfts and ring oscillators

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