Origins for fatigue-free properties of Bi-layered perovskite materials

  • B. H. Park
  • , B. S. Kang
  • , S. D. Bu
  • , T. W. Noh
  • , J. Lee
  • , H. D. Kim
  • , T. H. Kim

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

It is well known that ferroelectric Bi-layered perovskite materials, SrBi 2Ta 2O 3 (SBT) such as have fatigue-free properties due to an important role of Bi 2O 2 layers. However, Bi 4Ti 3O 12 (BTO) films showed severe fatigue failures in spite of the presence of Bi 2O 2 layers. In order to find the origins for fatigue-free behaviors of Bi-layered perovskite materials, we performed x-ray photoemission spectroscopy (XPS) measurements for SrBi 2Ta 2O 9 (SBT) and BTO films. From the XPS measurements, it was suggested that the difference in chemical stability of the metal-oxygen octahedra should be related to different fatigue behaviors of the SBT and the BTO films. In order to ascertain the above suggestion, we made worse chemical stability of SBT films by substituting for Sr ions and Ta ions with Bi ions and Ti ions, respectively. As expected, the resulting material, that is Bi 3TiTaO 9, showed serious fatigue failures. Therefore, we concluded that the stability of the perovskite layers, as well as an important role of the Bi 2O 2 layers, should be considered as origins for fatigue-free behaviors of Bi-layered perovskite materials.

Original languageEnglish
Pages (from-to)S1306-S1309
JournalJournal of the Korean Physical Society
Volume35
Issue numberSUPPL. 5
StatePublished - 1999

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