OC-FakeDect: Classifying deepfakes using one-class variational autoencoder

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

173 Scopus citations

Abstract

An image forgery method called Deepfakes can cause security and privacy issues by changing the identity of a person in a photo through the replacement of his/her face with a computer-generated image or another person's face. Therefore, a new challenge of detecting Deepfakes arises to protect individuals from potential misuses. Many researchers have proposed various binary-classification based detection approaches to detect deepfakes. However, binary-classification based methods generally require a large amount of both real and fake face images for training, and it is challenging to collect sufficient fake images data in advance. Besides, when new deepfakes generation methods are introduced, little deepfakes data will be available, and the detection performance may be mediocre. To overcome these data scarcity limitations, we formulate deepfakes detection as a one-class anomaly detection problem. We propose OC-FakeDect, which uses a one-class Variational Autoencoder (VAE) to train only on real face images and detects non-real images such as deepfakes by treating them as anomalies. Our preliminary result shows that our one class-based approach can be promising when detecting Deepfakes, achieving a 97.5% accuracy on the NeuralTextures data of the well-known FaceForensics++ benchmark dataset without using any fake images for the training process.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
PublisherIEEE Computer Society
Pages2794-2803
Number of pages10
ISBN (Electronic)9781728193601
DOIs
StatePublished - Jun 2020
Event2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020 - Virtual, Online, United States
Duration: 14 Jun 202019 Jun 2020

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2020-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020
Country/TerritoryUnited States
CityVirtual, Online
Period14/06/2019/06/20

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